SPARK-350-Pt

817.NN.SPARK350PT

Conductive AFM - Silicon Probe with Pt tip side and reflex coating.

Each pack contains 10 probes

¥ 66,000

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Buy 5+ items (¥ 56,100 each)
In Stock 5

Description

f = 350 kHz   |   k = 42 N/m   |   reflex coating: Pt   |   tip coating: Pt

Conductive AFM probe for electrical characterization in both contact and AC modes (non-contact/tapping). The Spark 350 Pt probe has a conductive platinum coating on both sides of the probe and exhibits exemplary dimensional tolerances and tip sharpness ensuring high quality imaging and performance.

Applications include conductive AFM (CAFM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), and piezoresponse force microscopy (PFM).

Details

  • SPARK-350-Pt Specifications
  • Frequency (kHz):
    350.0
  • Min Frequency (kHz):
    300.0
  • Max Frequency (kHz):
    400.0
  • Spring Constant (N/m):
    42.0
  • Min Spring Constant (N/m):
    25.0
  • Tip Radius (nm):
    5.0
  • Tip Height (um):
    12.0
  • Min Tip Height (nm):
    10.0
  • Max Tip Height (nm):
    13.0
  • Length, Width, Thickness (µm):
    125 x 30 x 4.5
  • Tip Shape:
    Conical
  • Tip Material:
    Silicon
  • Tip Coating:
    5nm Ti / 40nm Pt
  • Reflective Coating:
    5nm Ti / 40nm Pt
  • Manufacturer:
    NuNano
  • Max Spring Constant (N/m):
    70.0

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