Force modulation probe with a polycrystalline diamond coating doped with boron for topography and electrical measurements with high tip durability.
Each pack contains 10 probes
f = 61 kHz | k = 1.6 N/m | tip coating: Doped Diamond
Conductive AFM probes coated with doped diamond, suitable for electrical characterization in both contact mode and AC modes (non-contact/soft-tapping).
The Doped Diamond (DD) Probes offer a unique combination of tip hardness and conductivity. The tip side of these probes is coated with polycrystalline diamond. The diamond film is doped with boron to make it highly conducting.
The probes are suitable in air for: conducting scanning probe microscopy (c-AFM), electric force microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), and piezo-response force microscopy (PFM).
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