Shadow cast carbon replicas of diffraction line gratings - 2160 Lines/mm Diffraction Grating Replica 3mm. Shadow cast carbon replicas of diffraction line gratings (spacing 462.9 nm) which are used typically for calibrating electron-optical magnifications up to the x80,000 to x100,000 range.
Cobalt Standards block, Ideal for Quant optimization in INCA and Aztec. 5mm diameter x 5mm deep brass block.
Shadow cast carbon replicas of diffraction line gratings. This is a cross diffraction line grating replica 3mm.
Shadow cast carbon replicas of diffraction line gratings - 2160 Lines/mm Diffraction Grating Replica 3mm. Shadow cast carbon replicas of diffraction line gratings (spacing 462.9 nm) which are used typically for calibrating electron-optical magnifications up to the x80,000 to x100,000 range.
EDX calibration standard which has been specifically designed to help calibrate any EDX system, supplied with data sheet. Dimensions: 25mm diameter x 5mm deep brass block.
Evaporated Aluminium Film 3mm. The film's small crystallite size produces ring patterns that are suitable for calibration.
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Feature Standards Block (4 standards) Image Calibration Standard (Included with GSR and recommended for INCA Feature installations). This standard contains carbon, cobalt, rhodium and gold mounted in a 12.5mm diameter stub.
The kit contains two test specimens: one with synthetic GSR particles and one with synthetic particles for automated particle analyses using SEM/EDX. This Synthetic Particle Specimen (SPS) has been specifically designed for the adjustment and validation of analytical SEM/EDX systems used for automated analysis of Gunshot Residue (GSR) samples. It is especially useful for quick system validation checks and quality assurance procedures.
GSR Validation Standard 150nm Au. A synthetic GSR calibration standard with defined Pb/Sb/Ba particles in known locations can help to avoid or detect systematic errors in the GSR analysis system and improve the quality of the overall results.
Oriented single crystal gold foil on 3.05mm grid. Resolution, image quality, magnification and instrumental stability in higher resolution TEM's can be checked by setting up the conditions for imaging the 0.204nm (200 plane), 0.144nm (220 plane) and 0.102nm planar spacing in these specially prepared crystals.
5 x 5mm silicon chip coated with P47 phosphor allowing you to identify the position and the spot or line size of the beam when the X-ray touches the surface.
This range of polystyrene particles is excellent for SEM calibration purposes. It is possible to derive an internal standard of size by mixing a suitable concentration of these particles with the particles of unknown size being studied.
STANDARDS BLOCK SET 1 - 37 standards covering 42 elements plus Faraday cup.
WDS Standards block containing 20 standards. Each standard contains a selection of reference materials in the form of elements or compounds that are optimised for specific calibration tasks.