AFM PROBES

Conductive probe with symmetric conical tip for multipurpose nano-electrical measurements.

Each pack contains 10 probes.

NOTICE: This product is a direct replacement to the discontinued Adama Innovations AD-40-AS

With an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime. Each pack contains 5 probes.

This product is a direct replacement to the discontinued Kelvin Nanotechnology KNT-STHM.

NOTICE: This product is recommended for qualitative or relative measurements of variations in local temperature or thermal conductivity up to 150 C. It is not recommend for quantitative or accurate local temperature measurements, especially exceeding 60 C, as results are generally inconsistent even if calibration is attempted against known sample temperatures.​

This product is a direct replacement to the discontinued OLYMPUS AC200TS

Silicon probe with visible apex tip for soft tapping, force modulation, or bimodal imaging on medium to hard samples.  Each pack contains 10 probes.

This product is a direct replacement to the discontinued OLYMPUS AC160TS-R3

Tapping / Non-Contact - Silicon Probe with visible apex tip. Each pack contains 10 probes.

This product is a direct replacement to the discontinued OLYMPUS AC240TS-R3

Tapping / Non-Contact / Force Modulation - Silicon Probe with visible apex tip. Each pack contains 10 probes.

This product is a direct replacement to the discontinued OLYMPUS AC55TS

Fast scanning and high-resolution imaging probe with visible apex tip ideal for imaging semiconductor samples. Each pack contains 10 probes.

Tapping / Non-Contact - Silicon Probe with Al reflex coating. Each pack contains 10 probes.

Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating. Each pack contains 10 probes.