Fast-scanning, high-resolution probe with a diamond-like carbon (HDC/DLC) tip for consistent performance and extended tip life — the ideal probe where measurement repeatability and throughput matter. Each pack contains 5 probes.
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Probe Specifications: |
Coatings: |
Usage: |
Compatibility: |
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k |
35 (30-45) N/m |
Reflex |
Al |
Gas |
✔ |
GetReal |
|
|
f |
1200 (1100-1400) kHz |
Tip |
HDC/DLC |
Liquid |
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blueDrive |
|
|
r |
7 (<10) nm |
Lever |
Quartz |
|
|
blueDrive |
✔ |
The QUANTUM-AC55 is a high-frequency quartz cantilever probe built for surface roughness measurements and high-resolution imaging applications where tip consistency and longevity are the primary performance requirements. It is particularly well-suited to semiconductor characterization workflows — wafer roughness, thin film inspection, and device surface characterization — though its advantages carry equally well into any application where probe-to-probe repeatability and reduced recalibration overhead are priorities.
The diamond-like carbon (HDC/DLC) tip delivers substantially longer usable lifetime than bare silicon, maintaining its geometry through extended scanning sessions. This directly translates into more consistent roughness measurements (Ra, Rq) over time and across probe changes — a meaningful advantage in production and QC environments where variance from tip wear is unacceptable.
The quartz cantilever provides a high, stable resonance frequency (nominally 1200 kHz) with a higher Q-factor than silicon, supporting clean, low-noise tapping mode operation at fast scan rates. Every probe is individually measured in high-resolution SEM and ships with nanotools' TrueDimensions™ quality datasheet, confirming tip radius and tilt compensation angle — accessible via QR code on the chip package.
Compatible with Oxford Instruments Jupiter blueDrive™ photothermal excitation.
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