AZtecAM is the leading global solution for the characterisation of metal powders used in Additive Manufacturing. It is a tailored version of the AZtecFeature particle analysis platform that is fully optimised to characterise all aspects of AM metal powders including contaminant detection and powder recyclability.
For more licensing details and system requirements, please visit: Oi View - Licenses
✓ Detectors: compatible with all Oxford Instruments EDS detectors, including legacy models. No detector upgrade required.
! Base software: requires AZtecFeature to be purchased, installed and licensed first. AZtecGeo is an application module that runs inside AZtecFeature.
! Software: requires AZtec 6.2 or later already installed on your acquisition PC.
✓ Microscope: any SEM or FIB-SEM running AZtec. Automated stage control is needed for large-area runs.
Check your version and how to update.
Only one license can be generated per order.
Once you have purchased AZtecMineral you will receive the product key in an email notification from no-reply@estore.oxinst.com or noreply.NA.softwarelicensing@sentinelcloud.com, which will also include instructions on how to activate the licence.
Please read this document for more on how to activate your licence.
*Price excludes local sales taxes which will be applied at checkout.
AZtecAM is an application module for AZtecFeature. It is not a standalone product. You must already own and have installed AZtecFeature on your acquisition PC. Because AZtecAM runs inside AZtecFeature, it inherits the same hardware compatibility: it works with every Oxford Instruments EDS detector and with any SEM or FIB-SEM that already runs AZtec.
AZtecAM optimises the particle analysis workflow to enable the rapid and accurate characterisation of metal powders. It is ideal for the detection and identification of contaminants in powders, the characterisation of powder grain morphology, and the in-depth investigation of individual grains, providing the information needed to ensure your additive manufacturing process and products are of the highest quality.
Complete AM powder characterisation:
• Detect and identify contaminants
• Characterise powder morphology
• In-depth review of individual particles of interest
How it works:
• Automatically analyses powders over large area sample stubs, up to 200,000 particles per sample
• Particles, and the grains within them, are detected using atomic number contrast from a backscattered electron image
• A combination of X-ray data and morphological data from the BSE image is used to identify the particles
• Quantification is performed by real-time full quantitative analysis during acquisition, including Tru-Q processing
• Morphological and compositional information from each particle is stored in a database and can be retrieved and re-analysed in greater detail at any time
Applications:
• Investigating powders during production
• Determining whether powders can be recycled or re-used, based on powder grain morphology
• Detecting contaminants and understanding their composition for source identification
Reporting:
Information is provided for individual particles as well as statistically over the whole sample: particle size distributions, morphology measurements, number of particles in each class, physical distribution on the sample stub, and histograms and scatterplots of any measured parameter.
Flexibility:
• Custom AM powder analysis on a multi-capable system
• Works with most SEMs and can be retrofitted to existing systems
• Particle relocation for further analysis using WDS, EBSD and complementary EDS techniques
• Upgrade paths include large area mapping and quantitative EDS mapping
For the complete product detail, application notes and publications, see: AZtecAM on nano.oxinst.com.
COMPATIBILITY:
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Required Base Software |
AZtecFeature (required). AZtecAM is a licensed application module and will not run without an active AZtecFeature licence on the same PC.
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Minimum AZtec version |
AZtec 6.2 |
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EDS Detectors |
All Oxford Instruments EDS detectors: Ultim Max, Ultim Extreme, Xplore, and legacy X-Max / X-Act |
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Multiple Detectors |
Up to four in parallel, 680 mm² total active area |
| Microscopes |
Any SEM or FIB-SEM running AZtec. Automated stage control required for large-area acquisition
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Operating System |
Windows 10/11 64-bit |
CAPIBILITY & LICENSING:
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Sample Format |
Large area powder sample stubs |
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Reported Outputs |
Particle size distribution, morphology measurements, class counts, physical distribution on stub, histograms and scatterplots |
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Max Particles Per Sample |
200,000 across thousands of fields of view |
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Peak Throughput |
In excess of 120,000 particles per hour (hardware dependent)
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Quantification |
Tru-Q / Tru-Q IQ with pulse pile-up correction; TruMap peak deconvolution |
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Data Export |
Reports to Microsoft Word; data export to Microsoft Excel; H5OINA format |
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License Type |
Permanent License. Periodic updates available through OI View Portal |
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Licenses per order |
One. Dongle locked to the acquisition PC. |
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