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SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 7.8mm pin

51-1625-0267
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
¥ 878
In Stock 15
Description

Description

SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 7.8mm pin

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SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 7.8mm pin product photo
SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 7.8mm pin
ID 51-1625-0267
¥ 878