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ASYVIP-TESPA

805.ASYVIP-TESPA
Tapping / Non-Contact - Etched Silicon Probe with Al reflex coating

Each pack contains 10 probes. 


¥ 34,000
In Stock 8
DescriptionDetails

Description

f = 300 kHz   |   k = 37 N/m   |   reflex coating: Al   |   tip coating: none


New ASYVIP-TESPA Value series AFM probes are ideal for standard tapping and non-contact mode in air

Etched Silicon Probes:

1. Versatile

These traditional etched silicon  probes enable imaging and mechanical measurements on a wide range of samples.

2. Consistent

Mature fabrication procedures and robust processing technology ensure consistent high quality and performance.

3. Reliable

Great for routine use in multiuser facilities and research labs.

 

Details

  • ASYVIP-TESPA Specifications
  • Frequency (kHz):
    300
  • Min Frequency (kHz):
    200
  • Max Frequency (kHz):
    400
  • Spring Constant (N/m):
    37
  • Min Spring Constant (N/m):
    13
  • Tip Radius (nm):
    9.0
  • Tip Height (um):
    15
  • Min Tip Height (nm):
    14.00
  • Max Tip Height (nm):
    16.00
  • Length, Width, Thickness (µm):
    125 x 30 x 4
  • Tip Shape:
    Pyramidal
  • Tip Material:
    Silicon
  • Tip Coating:
    None
  • Reflective Coating:
    Al
  • Manufacturer:
    Asylum Research
  • Max Spring Constant (N/m):
    77.0

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ASYVIP-TESPA
ID 805.ASYVIP-TESPA
¥ 34,000