Fast Current Mapping

Tip Coating

PtSi PtSi(2)

Tip Shape

Pyramidal Pyramidal(2)

Tip Radius

100-300 100-300(1)
<20nm <20nm(1)

Tip Height

15.0 15.0(2)

Reflex Coating

PtSi PtSi(2)

Applications

• Magnetics / Data Storage(2)

• Biomaterials(2)
• Biomolecules(2)
• Energy Storage(2)
• Food Science(2)
• Graphene / 2D Materials(2)
• Polymers(2)
• Semiconductors / Microelectronics(2)
• Solar / Photovoltaics(2)
• Thin Films(2)

Manufacturer

• AppNano(2)
• Asylum Research

• NuNano(1)

By Category

PRODUCTS PRODUCTS(13)
AFM PROBES AFM PROBES(13)
SEARCH BY MODE SEARCH BY MODE(13)
Tapping Mode Tapping Mode(2)
Contact Mode Contact Mode(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(4)
Force Maps Force Maps(1)
Magnetic Force Microscopy (MFM) Magnetic Force Microscopy (MFM)(5)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(1)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(3)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(5)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(3)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(1)
Fast Current Mapping Fast Current Mapping(2)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(1)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(3)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(2)
Nanolithography Nanolithography(2)
Loss Tangent Imaging Loss Tangent Imaging(1)
AFM PROBES CATALOG AFM PROBES CATALOG(13)