Electrochemical Strain Microscopy (ESM)

Tip Coating

Pt Pt(2)
PtSi PtSi(2)

Tip Shape

Pyramidal Pyramidal(2)
Triangular Triangular(2)

Tip Radius

10.0 10.0(1)
100-300 100-300(1)
20.0 20.0(1)
<20nm <20nm(1)
Show less

Tip Height

15.0 15.0(2)
80.0 80.0(2)

Reflex Coating

Pt Pt(2)
PtSi PtSi(2)

Applications

• Biomaterials(2)
• Biomolecules(2)
• Energy Storage(2)
• Food Science(2)
• Graphene / 2D Materials(2)
• Magnetics / Data Storage(2)
• Polymers(2)
• Semiconductors / Microelectronics(2)
• Solar / Photovoltaics(2)
• Thin Films(2)

Manufacturer

• AppNano(2)
• Rocky Mountain(2)

• Adama Innovations(2)
• Asylum Research(1)
• NuNano(1)
• Olympus(1)

By Category

PRODUCTS PRODUCTS(10)
AFM PROBES AFM PROBES(10)
SEARCH BY APPLICATION SEARCH BY APPLICATION(7)
SEARCH BY MODE SEARCH BY MODE(9)
Tapping Mode Tapping Mode(1)
Contact Mode Contact Mode(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(7)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(3)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(6)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(2)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(3)
Fast Current Mapping Fast Current Mapping(4)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(4)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(4)
Nanolithography Nanolithography(5)
SEARCH BY SPECIFICATION SEARCH BY SPECIFICATION(5)
AFM PROBES CATALOG AFM PROBES CATALOG(10)
New New(3)

In Stock

• false(2)
• true(2)