Contact Mode

Tip Coating

Diamond Diamond(1)
None None(1)
PtSi PtSi(1)

Tip Shape

3 sided 3 sided(1)
Pyramidal Pyramidal(1)
cone cone(1)

Tip Radius

10.0 10.0(1)
100-300 100-300(1)
Show all

Tip Height

14.0 14.0(1)
15.0 15.0(1)
300.0 300.0(1)

Reflex Coating

Cr/Au Cr/Au(2)
PtSi PtSi(1)

Applications

• Semiconductors / Microelectronics(3)

• Biomaterials(2)
• Biomolecules(2)
• Cells and Tissues(1)
• Energy Storage(3)
• Food Science(2)
• Graphene / 2D Materials(2)
• Magnetics / Data Storage(1)
• Piezoelectrics / Ferroelectrics(1)
• Polymers(2)
• Solar / Photovoltaics(3)
• Thin Films(3)

Manufacturer

• Adama Innovations(1)
• AppNano(1)
• Olympus(1)

By Category

PRODUCTS PRODUCTS(21)
AFM PROBES AFM PROBES(21)
SEARCH BY MODE SEARCH BY MODE(19)
Tapping Mode Tapping Mode(8)
Contact Mode Contact Mode(3)
Conductive AFM (CAFM) Conductive AFM (CAFM)(9)
Force Maps Force Maps(6)
Force Curves Force Curves(3)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(1)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(8)
Force Modulation Force Modulation(1)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(8)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(9)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(5)
Fast Current Mapping Fast Current Mapping(6)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(2)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(6)
Bimodal Dual AC Bimodal Dual AC(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(9)
Electrochemical AFM (EC-AFM) Electrochemical AFM (EC-AFM)(2)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(6)
Nanolithography Nanolithography(6)
Loss Tangent Imaging Loss Tangent Imaging(6)
AFM PROBES CATALOG AFM PROBES CATALOG(21)