New and improved Oxford exclusive probe coated with high coercivity material for Magnetic Force Microscopy (MFM) measurements of challenging materials.
Each pack contains 10 probes.
Tapping / Non-Contact - Silicon Probe with Al reflex coating.
Each pack contains 10 probes.
This product is a direct replacement to the discontinued OLYMPUS AC200TS
Silicon probe with visible apex tip for soft tapping, force modulation, or bimodal imaging on medium to hard samples.
Each pack contains 10 probes.
Force modulation probe with a polycrystalline diamond coating doped with boron for topography and electrical measurements with high tip durability.
Each pack contains 10 probes
Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.
Each pack contains 10 probes
Tapping / Non-Contact - Silicon Probe with Al reflex coating
Each pack contains 10 probes
This product is a direct replacement to the discontinued OLYMPUS AC240TS-R3
Tapping / Non-Contact / Force Modulation - Silicon Probe with visible apex tip.
Each pack contains 10 probes
Quantifoil 200 Mesh Copper R1.2 dia /1.3µm - Holey Carbon Films. Circular hole, size 1.2µm dia, separation 1.3µm, pitch 2.5µm.
This product is a direct replacement to the discontinued OLYMPUS AC160TS-R3
Tapping / Non-Contact - Silicon Probe with visible apex tip.
Each pack contains 10 probes.
Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating.
Each pack contains 10 probes.
Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating
Each pack contains 10 probes.
Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.
Each pack contains 10 probes