Conductive AFM - Silicon Probe with Pt tip side and reflex coating.
Each pack contains 10 probes
New and improved Oxford exclusive probe coated with high coercivity material for Magnetic Force Microscopy (MFM) measurements of challenging materials.
Each pack contains 10 probes.
Tapping / Non-Contact - Silicon AFM Probe with Al reflex coating. Each pack contains 10 probes.
High precision grade Titanium steel tweezers 5. Straight, extra fine tips. Length 110mm. Tip measures 0.05 x 0.01mm
Tapping / Non-Contact - Silicon Probe with Al reflex coating.
Each pack contains 10 probes.
Tapping / Non-Contact - Silicon AFM Probe with Au reflex coating. Each pack contains 10 probes.
High precision grade Titanium steel tweezers N5. Straight, extra fine tips. Length 110mm. Tip measures 0.05 x 0.01mm
This product is a direct replacement to the discontinued OLYMPUS AC200TS
Silicon probe with visible apex tip for soft tapping, force modulation, or bimodal imaging on medium to hard samples.
Each pack contains 10 probes.
Tapping / Non-Contact - Silicon AFM Probe with Al reflex coating. Each pack contains 10 probes.
Force modulation probe with a polycrystalline diamond coating doped with boron for topography and electrical measurements with high tip durability.
Each pack contains 10 probes
Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.
Each pack contains 10 probes