ELECTRON MICROSCOPY

Tapping / Non-Contact - Silicon Probe with Al reflex coating.

Each pack contains 10 probes.

Force modulation probe with a polycrystalline diamond coating doped with boron for topography and electrical measurements with high tip durability.

Each pack contains 10 probes

Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.

Each pack contains 10 probes

Tapping / Non-Contact - Silicon Probe with Al reflex coating

Each pack contains 10 probes

This product is a direct replacement to the discontinued OLYMPUS AC240TS-R3

Tapping / Non-Contact / Force Modulation - Silicon Probe with visible apex tip.

Each pack contains 10 probes

This product is a direct replacement to the discontinued OLYMPUS AC160TS-R3

Tapping / Non-Contact - Silicon Probe with visible apex tip.

Each pack contains 10 probes.

Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating.

Each pack contains 10 probes.

Tapping / Non-Contact / Force Modulation - Silicon Probe with Al reflex coating

Each pack contains 10 probes.

Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.

Each pack contains 10 probes