SEM Specimen stubs

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    Gold Disc Target, 57mm dia x 0.1mm, Coater Type 1 product photo
    Gold Disc Target, 57mm dia x 0.1mm, Coater Type 1
    A range of spare targets is available for most well known makes of sputter coaters.
    ID 51-1625-0360
    ¥ 85,100.00
    In Stock 6
    Slotted specimen stub product photo
    Slotted specimen stub
    12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination.
    ID 51-1625-0031
    ¥ 1,260.00
    In Stock 6
    SEM Stub (pin format) for TEM Grids product photo
    SEM Stub (pin format) for TEM Grids
    SEM Stub (pin format) for TEM Grids
    ID 51-1625-0196
    ¥ 10,700.00
    In Stock 6
    Aluminium pin stubs, 32 mm dia. Pack of 50 product photo
    Aluminium pin stubs, 32 mm dia. Pack of 50
    Aluminium pin stubs, 32 mm dia. Pack of 50
    ID 51-1625-0259
    ¥ 14,900.00
    In Stock 8
    JEOL stubs, aluminium. Pack of 50 product photo
    JEOL stubs, aluminium. Pack of 50
    JEOL stubs, aluminium. Pack of 50
    ID 51-1625-0050
    ¥ 2,300.00
    In Stock 10
    SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin product photo
    SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin
    SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium.
    ID 51-1625-0273
    ¥ 12,000.00
    In Stock 10
    12.5mm dia cylinder stub converter for JEOL product photo
    12.5mm dia cylinder stub converter for JEOL
    12.5mm dia cylinder stub converter for JEOL
    ID 51-1625-0282
    ¥ 2,100.00
    In Stock 10
    Mica Sheets 75mm x 25mm x 0.15mm thick (Pack of 20) product photo
    Mica Sheets 75mm x 25mm x 0.15mm thick (Pack of 20)
    Mica Sheets 75mm x 25mm x 0.15mm thick (Pack of 20)
    ID 51-1625-0233
    ¥ 12,000.00
    In Stock 1
    Aluminium pin stubs, 25 mm dia. Pack of 50 product photo
    Aluminium pin stubs, 25 mm dia. Pack of 50
    Aluminium pin stubs, 25 mm dia. Pack of 50
    ID 51-1625-0257
    ¥ 12,000.00
    In Stock 10
    SEM Specimen Stubs 12.5mm dia, 3.2x8mm pin no groove pk100 product photo
    SEM Specimen Stubs 12.5mm dia, 3.2x8mm pin no groove pk100
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
    ID 51-1625-0256
    ¥ 4,600.00
    In Stock 10
    Cobalt standard product photo
    Cobalt standard
    Cobalt Standards block, Ideal for Quant optimization in INCA and Aztec.

    5mm diameter x 5mm deep brass block.

    ID 51-1606-001
    ¥ 30,000.00
    In Stock 1
    Ink pen for SEM product photo
    Ink pen for SEM
    Fine point writing pen which leaves a mark that can be read in the electron beam of the SEM.
    ID 51-1625-0010
    ¥ 900.00
    In Stock 10
    Mica Sheets 25mm x 25mm x 0.15mm thick (Pack of 20) product photo
    Mica Sheets 25mm x 25mm x 0.15mm thick (Pack of 20)
    Mica Sheets 25mm x 25mm x 0.15mm thick (Pack of 20)
    ID 51-1625-0169
    ¥ 6,900.00
    In Stock 1
    SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 9.5mm pin product photo
    SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 9.5mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
    ID 51-1625-0269
    ¥ 900.00
    In Stock 15
    SEM Specimen Stubs Aluminium 12.5mm dia 3.2 x 6mm pin PK100 product photo
    SEM Specimen Stubs Aluminium 12.5mm dia 3.2 x 6mm pin PK100
    SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm. Aluminium.
    ID 51-1625-0199
    ¥ 4,300.00
    In Stock 9
    SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 7.8mm pin product photo
    SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 7.8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
    ID 51-1625-0267
    ¥ 900.00
    In Stock 15
    SEM Specimen Stubs, 12.5mm dia, carbon product photo
    SEM Specimen Stubs, 12.5mm dia, carbon
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
    ID 51-1625-0091
    ¥ 1,100.00
    Out of stock
    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread (pk 50) product photo
    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread (pk 50)
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium.
    ID 51-1625-0272
    ¥ 10,800.00
    In Stock 7
    Aluminium pin stubs. Pack of 100 product photo
    Aluminium pin stubs. Pack of 100
    Aluminium pin stubs. Pack of 100
    ID 51-1625-0139
    ¥ 4,300.00
    In Stock 9
    SEM Specimen Stubs, 12.5mm dia, 10mm high product photo
    SEM Specimen Stubs, 12.5mm dia, 10mm high
    SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.
    ID 51-1625-0263
    ¥ 2,700.00
    Pre Order Now
    SEM Specimen Stubs, 12.5mm dia, 45deg chamfer PK10 product photo
    SEM Specimen Stubs, 12.5mm dia, 45deg chamfer PK10
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    ID 51-1625-0140
    ¥ 2,600.00
    In Stock 6

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