KPFM scans topography in tapping mode and maps surface potential
differences between a sample and conductive probe tip to measure sample work function, trapped charge, or voltage potential differences
in active devices, There are many variants, single and dual-pass
amplitude modulation being the most common, however more powerful AM sideband heterodyne versions are also available.

Tip wear is less of an issue with KPFM, because it is a non-contact
technique. Good signal is the priority – and Platinum coatings tend to
provide that. Consider symmetrical tips to minimize long range artifacts as well.