SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin

51-1625-0805
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
$ 17.32
In Stock 2

Description

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, double 90° chamfer, pin length 9.5mm. Aluminium.

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