SEM Specimen stubs

25.4mm x 6mm pin height; Shorter pin for all Zeiss/LEO 1500 SEM, FESEM & FIB systems.

Aluminum specimen mount pin for mounting samples for ultramicrotomy. Available in two types: Slotted Screw and Bullseye.
This item is on pre-order and will take between 1-2 weeks to arrive.

Assorted Aluminium SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, choose your type and pack size from the dropdown menu.

(LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS, 45° chamfer. Aluminium. 10 pack)

Aluminium pin stubs, 32mm in diameter. SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. Pin length 8mm. Pack of 50.

SEM Specimen Stubs, 10mm dia, 10mm high, made of carbon. Supplied individually. Other variations available, choose from the dropdown menu. 

Laser etched serialised standard 12.5mm dia aluminium pin stubs with pre-mounted carbon tabs, suitable for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.

12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination.(Sold as singles)

SEM Stub (pin format) for TEM Grids which allows four TEM grids to be securely held for SEM work.

Copper Mini Pin Stub for Cryo for ZEISS/LEO with 6.25mm, shorter pin, Head 6.6 x 1.2mm (Pk 100). Mini pin stubs are ideal for small samples, or parts which need to be examined individually.

Mini Head SEM Mount: 6.6 x 1.3mm, Pin: 9.5mm.

New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 12.7 x 12.7mm (1/2" x 1/2")

SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium.

SEM Pin Stub 25.4mm diameter with 9.5mm pin height.

12.5mm dia cylinder stub adaptor / converter for JEOL, they accommodate the standard pin type stub format of the European and USA manufacturers.

SEM Specimen Stub for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

SEM Specimen Stub for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon

High Purity Aluminium pin stubs that come in a pack of 100. 12.5mm dia, pin length 8mm, pin diameter 3.2mm.

EBSD sample stub XL20 - Aluminium sample pin stub specially developed for EBSD with a flat on the pin and on the edge to aid repeatable sample alignment in the SEM.

Dimensions :
12.5mm diameter stub.
3.2mm diameter pin.

SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high with M4 thread. Made from Aluminium. Choose your size from the dropdown menu.

This TEM Grid holder allows for the holding of up to 4 grids. Made from aluminum with a brass screw this holder allows you to image and analyze specimens on TEM Grids in the SEM.

This item is on pre-order and will take between 1-2 weeks to arrive.