TKD sample holder designed to be used together with the standard universal pre-tilted sample holder supplied with the Aztec EBSD system. Specifically designed for TKD analysis, it provides a way of easy mounting and positioning of the thin sample. Once mounted, the user uses the standard AZtec EBSD system to acquire and analyse the results.
The Oxford Instruments TKD sample holder is designed to be used together with the standard universal pre-tilted sample holder supplied with the Aztec EBSD system (51-H5-550).
The TKD sample holder replaces the top part of the standard universal pre-tilted sample holder. Supplied with TKD sampled holder manual. It is recommended that the TKD sample holder is used in conjunction with the Oxford Instruments AZtec EBSD system.
For best results use the AZtec version 3.0 or later software. TKD uses conventional EBSD hardware and software, but the samples are thin, electron transparent samples. The diffraction signal is obtained from a few to tens of nanometres above the bottom of the sample surface, so sample preparation is important. The main difference between EBSD and TKD is how the sample is positioned in the SEM chamber.
A typical representation of the configuration required is shown below. In this representation, the sample is positioned at 20° to the electron beam. However, other studies orientate the sample horizontally. The optimum angle to use depends on the position of the EBSD detector and the working distance.
TKD data can be collected and presented in the same way as conventional EBSD data.
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