Time Dependent Dielectric Breakdown (TDDB)

Tip Coating

PtSi PtSi(2)
Ti/Pt Ti/Pt(1)

Tip Shape

3 sided 3 sided(1)
Pyramidal Pyramidal(2)

Tip Radius

25.0 25.0(1)
<20nm <20nm(2)
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Tip Height

14.0 14.0(1)
15.0 15.0(2)

Reflex Coating

AI AI(1)
PtSi PtSi(2)

Applications

• Energy Storage(3)
• Food Science(3)
• Thin Films(3)

• Biomaterials(3)
• Biomolecules(3)
• Cells and Tissues(1)
• Graphene / 2D Materials(3)
• Magnetics / Data Storage(2)
• Polymers(3)
• Semiconductors / Microelectronics(3)
• Solar / Photovoltaics(3)

Manufacturer

• AppNano(2)
• Olympus(1)

By Category

PRODUCTS PRODUCTS(14)
AFM PROBES AFM PROBES(14)
SEARCH BY MODE SEARCH BY MODE(12)
Tapping Mode Tapping Mode(7)
Contact Mode Contact Mode(1)
Video-Rate AFM Video-Rate AFM(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(3)
Force Maps Force Maps(6)
Force Curves Force Curves(3)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(1)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(2)
Force Modulation Force Modulation(1)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(2)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(3)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(5)
Fast Current Mapping Fast Current Mapping(2)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(6)
Bimodal Dual AC Bimodal Dual AC(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(3)
Electrochemical AFM (EC-AFM) Electrochemical AFM (EC-AFM)(2)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(2)
Nanolithography Nanolithography(2)
Loss Tangent Imaging Loss Tangent Imaging(6)
AFM PROBES CATALOG AFM PROBES CATALOG(14)

In Stock

• true(3)

• false(3)