Scanning Capacitance Mode (SCM)

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        • 10.0(1)
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                      • PRODUCTS(5)
                      • AFM PROBES(5)
                      • SEARCH BY APPLICATION(2)
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                      • Conductive AFM (CAFM)(4)
                      • Scanning Capacitance Mode (SCM)(3)
                      • Piezoresponse Force Microscopy (PFM)(3)
                      • Fast Current Mapping(2)
                      • Time Dependent Dielectric Breakdown (TDDB)(1)
                      • Electrochemical Strain Microscopy (ESM)(2)
                      • Nanolithography(3)
                      • AFM PROBES CATALOG(5)
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                        25PT300B product photo
                        25PT300B
                        ID 808.RMN.25PT300B
                        $ 450.00
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                        25PT400B
                        ID 808.RMN.25PT400B
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                        25PT300B-10 product photo
                        25PT300B-10
                        ID 808.RMN.25PT300B10
                        $ 560.00
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