Magnetic Force Microscopy (MFM) is a two-pass imaging mode where a magnetized AFM probe tip images the surface in the first pass and then lifts above the surface by a constant height to image the longer-range magnetic forces in a second pass to separate from the shorter-range atomic forces.

The MFM probe is coated with a thin magnetic film to create a stray magnetic field that can interact with the magnetic field on the surface of the sample, so this technique can also visualize the magnetic domains with high resolution. MFM testing is typically performed at room temperature in air, but can also be done in other environmental conditions The sample does not need to be conductive, and an additional magnetic field can be added to modify the sample magnetic domains so as long as the magnetization of the probe is not affected during the measurement.

The standard MFM probe can address most scenarios well, however we
recommend the MFM sampler back if you suspect you may require a probe with modified characteristics, such as higher or lower moment or coercivity.