Kelvin Probe Force Microscopy (KPFM)

Tip Coating

CoCr CoCr(2)

Tip Shape

3 sided 3 sided(1)
Rectangular Rectangular(1)

Tip Radius

32.0 32.0(1)
47.0 47.0(1)

Tip Height

12.5 12.5(2)

Reflex Coating

CoCr CoCr(2)

Applications

• Magnetics / Data Storage(2)

Manufacturer

• Asylum Research(2)
• Olympus

• AppNano(2)
• NuNano(2)

By Category

PRODUCTS PRODUCTS(7)
AFM PROBES AFM PROBES(7)
SEARCH BY MODE SEARCH BY MODE(7)
Tapping Mode Tapping Mode(3)
Conductive AFM (CAFM) Conductive AFM (CAFM)(1)
Force Maps Force Maps(3)
Force Curves Force Curves(1)
Magnetic Force Microscopy (MFM) Magnetic Force Microscopy (MFM)(2)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(1)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(2)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(3)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(3)
Electrochemical AFM (EC-AFM) Electrochemical AFM (EC-AFM)(1)
Loss Tangent Imaging Loss Tangent Imaging(3)
AFM PROBES CATALOG AFM PROBES CATALOG(7)

In Stock

• true(2)