Force Maps

Tip Coating

None None(4)

Tip Shape

Conical Conical(2)
Tetrahedral Tetrahedral(2)

Tip Radius

5.0 5.0(2)
7.0 7.0(2)

Tip Height

12.0 12.0(2)
14.0 14.0(2)

Reflex Coating

AI AI(2)
AU AU(1)
Show all

Applications

• Biomaterials(4)
• Biomolecules(4)
• Cells and Tissues(1)
• Energy Storage(4)
• Food Science(4)
• Graphene / 2D Materials(3)
• Magnetics / Data Storage(3)
• Polymers(3)
• Semiconductors / Microelectronics(3)
• Solar / Photovoltaics(4)
• Thin Films(3)

Manufacturer

• Asylum Research(2)
• NuNano(2)

• Olympus(4)

By Category

PRODUCTS PRODUCTS(12)
MICROSCOPY SUPPLIES MICROSCOPY SUPPLIES(1)
AFM PROBES AFM PROBES(12)
SEARCH BY APPLICATION SEARCH BY APPLICATION(12)
SEARCH BY MODE SEARCH BY MODE(10)
Tapping Mode Tapping Mode(4)
Contact Mode Contact Mode(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(4)
Force Maps Force Maps(4)
Force Curves Force Curves(2)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(4)
Force Modulation Force Modulation(1)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(4)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(4)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(3)
Fast Current Mapping Fast Current Mapping(2)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(1)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(4)
Bimodal Dual AC Bimodal Dual AC(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(4)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(2)
Nanolithography Nanolithography(2)
Loss Tangent Imaging Loss Tangent Imaging(4)
SEARCH BY SPECIFICATION SEARCH BY SPECIFICATION(8)
AFM PROBES CATALOG AFM PROBES CATALOG(12)
LEARN ABOUT PROBES LEARN ABOUT PROBES(6)
NEW NEW(6)