Fast Current Mapping

Tip Coating

5nm Ti / 40nm Pt 5nm Ti / 40nm Pt(1)
Pt Pt(2)

Tip Shape

Conical Conical(1)
Triangular Triangular(1)

Tip Radius

10.0 10.0(1)
20.0 20.0(1)
Show all

Tip Height

12.0 12.0(1)
80.0 80.0(2)

Reflex Coating

5nm Ti / 40nm Pt 5nm Ti / 40nm Pt(1)
Pt Pt(2)

Applications

• Biomaterials(1)
• Biomolecules(1)
• Energy Storage(1)
• Food Science(1)
• Graphene / 2D Materials(1)
• Magnetics / Data Storage(1)
• Polymers(1)
• Semiconductors / Microelectronics(1)
• Solar / Photovoltaics(1)
• Thin Films(1)

Manufacturer

• NuNano(1)
• Rocky Mountain(2)

• Adama Innovations(2)
• AppNano(2)
• Asylum Research(1)
• Olympus(1)

By Category

PRODUCTS PRODUCTS(11)
MICROSCOPY SUPPLIES MICROSCOPY SUPPLIES(1)
AFM PROBES AFM PROBES(11)
SEARCH BY APPLICATION SEARCH BY APPLICATION(8)
SEARCH BY MODE SEARCH BY MODE(8)
Tapping Mode Tapping Mode(2)
Conductive AFM (CAFM) Conductive AFM (CAFM)(6)
Force Maps Force Maps(2)
Force Curves Force Curves(1)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(3)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(5)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(2)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(2)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(2)
Fast Current Mapping Fast Current Mapping(3)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(2)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(3)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(3)
Nanolithography Nanolithography(4)
Loss Tangent Imaging Loss Tangent Imaging(2)
SEARCH BY SPECIFICATION SEARCH BY SPECIFICATION(2)
AFM PROBES CATALOG AFM PROBES CATALOG(11)
LEARN ABOUT PROBES LEARN ABOUT PROBES(8)
NEW NEW(2)