Electrostatic Force Microscopy (EFM)

Tip Coating

PtSi PtSi(2)

Tip Shape

Pyramidal Pyramidal(2)

Tip Radius

<20nm <20nm(2)
Show less

Tip Height

15.0 15.0(2)

Reflex Coating

PtSi PtSi(2)

Applications

• Biomolecules(2)
• Semiconductors / Microelectronics(2)
• Solar / Photovoltaics(2)
• Thin Films(2)

• Biomaterials(2)
• Energy Storage(2)
• Food Science(2)
• Graphene / 2D Materials(2)
• Magnetics / Data Storage(2)
• Polymers(2)

Manufacturer

• AppNano(2)
• Asylum Research

• Olympus(1)

By Category

PRODUCTS PRODUCTS(5)
AFM PROBES AFM PROBES(5)
SEARCH BY MODE SEARCH BY MODE(5)
Tapping Mode Tapping Mode(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(2)
Force Maps Force Maps(1)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(2)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(1)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(2)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(1)
Fast Current Mapping Fast Current Mapping(1)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(2)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(1)
Nanolithography Nanolithography(1)
Loss Tangent Imaging Loss Tangent Imaging(1)
AFM PROBES CATALOG AFM PROBES CATALOG(5)

In Stock

• true(2)

• false(1)