EFM is a common electrical AFM mode that provides useful qualitative
information about the electric field gradient on the surface of a sample, thus providing a mechanism for comparison in relation to the electrical properties of the sample. EFM is also a type of tapping mode in which the tip of the tip is lifted above the surface (usually only a few tens of nanometers) during scanning, and a voltage is applied between the tip and the sample to produce a length and qualitative information on the charge distribution. The electrostatic interaction depends on the distance between the tip and the sample, and the resonance of the cantilever.

Tip wear is less of an issue with EFM &, because it is a non-contact
technique. Good signal is the priority – and Platinum coatings tend to provide that. Consider symmetrical tips to minimize long range artifacts as well.