Contact Resonance Viscoelastic Mapping

Tip Coating

Diamond Diamond(1)
None None(2)

Tip Shape

3 sided 3 sided(1)
Conical Conical(1)
Tetrahedral Tetrahedral(1)

Tip Radius

10.0 10.0(1)
7.0 7.0(2)

Tip Height

14.0 14.0(2)
300.0 300.0(1)

Reflex Coating

AI AI(1)
Aluminium Aluminium(1)
Show all

Applications

• Biomaterials(2)
• Biomolecules(2)
• Cells and Tissues(2)
• Energy Storage(3)
• Food Science(2)
• Piezoelectrics / Ferroelectrics(1)
• Semiconductors / Microelectronics(1)
• Solar / Photovoltaics(3)
• Thin Films(1)

Manufacturer

• Adama Innovations(1)
• Asylum Research(1)
• Olympus(1)

• AppNano(1)

By Category

PRODUCTS PRODUCTS(28)
AFM PROBES AFM PROBES(28)
SEARCH BY APPLICATION SEARCH BY APPLICATION(27)
SEARCH BY MODE SEARCH BY MODE(27)
Tapping Mode Tapping Mode(14)
Contact Mode Contact Mode(4)
Video-Rate AFM Video-Rate AFM(3)
Conductive AFM (CAFM) Conductive AFM (CAFM)(6)
Force Maps Force Maps(10)
Force Curves Force Curves(8)
Magnetic Force Microscopy (MFM) Magnetic Force Microscopy (MFM)(5)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(2)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(4)
Force Modulation Force Modulation(3)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(8)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(5)
Fast Force Mapping (FFM) Fast Force Mapping (FFM)(7)
Fast Current Mapping Fast Current Mapping(4)
Scanning Tunneling Microscopy (STM) Scanning Tunneling Microscopy (STM)(2)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(3)
AM-FM Viscoelastic Mapping AM-FM Viscoelastic Mapping(11)
Bimodal Dual AC Bimodal Dual AC(5)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(5)
Higher Eigenmode Tapping Higher Eigenmode Tapping(2)
Electrochemical AFM (EC-AFM) Electrochemical AFM (EC-AFM)(4)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(4)
Nanolithography Nanolithography(4)
Loss Tangent Imaging Loss Tangent Imaging(8)
SEARCH BY SPECIFICATION SEARCH BY SPECIFICATION(24)
AFM PROBES CATALOG AFM PROBES CATALOG(28)
LEARN ABOUT PROBES LEARN ABOUT PROBES(11)
NEW NEW(5)