A Force Map is simply a structured array of force curves, that can build an image or map of these measured material properties in an area on the sample surface.

AFM probe selection can be tricky here. It’s very important to match the spring constant to the range of tip-sample forces you will be measuring, Too soft – you may exceed the limits of detectable cantilever deflection; too stiff – you may not have enough cantilever deflection to measure. Tip geometry plays a large role is repeatability, especially for soft samples with deep indentations.

AFM force curves can be used to determine a sample's various mechanical properties, including adhesion, stiffness, viscoelasticity, unfolding/tensile measurements, and indentation depth.