Conductive AFM (CAFM) scans topography in contact mode while measuring any electrical current flowing through the sample into the conductive AFM probe with a specialized probe holder.

Additionally, this mode allows for localized current versus voltage (I-V) measurements which can be made a specific user-defined positions to map the electrical characteristics of a sample.

The AFM probes for CAFM are coated with electrically conductive materials such as. platinum, gold, iridium, platinum silicide, and conductive doped diamond.

A specialized probe holder is required for this technique. Tip wear is a common challenge in CAFM. While platinum is the best “daily driver” coating, you may want to consider tougher coatings if your experiment is lengthy or sample is rough/hard, such as: platinum-iridium alloy, platinum silicide, or doped-diamond.