Model 70-1D with Cert Unmounted
For General Purpose and Metrology Microscopes: A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch.
Surface: Silicon Oxide ridges on Silicon, 4 x 3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated.
This item is on pre-order and will take around 1-2 weeks to arrive.
This item is on pre-order and will take around 1-2 weeks to arrive.
Watlow Heaters 40V. 40W. Dia = 0.125". Length = 1.0
These standards are supplied as ¼" (33mm) diameter pressed pellets or metal foils, and are prepared from selected high purity elements and compounds to ensure interference free-spectra. They are suitable for use by experienced spectroscopists as well as staff training.
This item is on pre-order and will take around 1-2 weeks to arrive.