Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
f = 285 kHz | k = 42 N/m | tip coating: none
Arrow™ - Non-contact / Tapping™ mode NanoWorld Arrow™
NC probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm. Additionally, this probe offers a tip radius of curvature of less than 10 nm. The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped silicon to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
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