SEM Specimen Stubs, 12.5mm dia, 20° chamfer

51-1625-0425
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
£ 19.83
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Description

SEM Specimen Stubs, 12.5mm dia, 45deg chamfer PK10

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