1. Home/
  2. Products/
  3. AFM PROBES/
  4. SEARCH BY MODE/
  5. Time Dependent Dielectric Breakdown (TDDB)

Time Dependent Dielectric Breakdown (TDDB)

      • 80.0(1)
        • Pt(1)

        Spring Constant

        • from

          • to

            Frequency

            • from

              • to

                  • Products(5)
                  • AFM PROBES(5)
                  • SEARCH BY MODE(4)
                  • Conductive AFM (CAFM)(4)
                  • Scanning Capacitance Mode (SCM)(3)
                  • Piezoresponse Force Microscopy (PFM)(3)
                  • Fast Current Mapping(2)
                  • Time Dependent Dielectric Breakdown (TDDB)(1)
                  • Electrochemical Strain Microscopy (ESM)(2)
                  • Nanolithography(3)
                  • AFM PROBES CATALOG(5)
                  1 list item
                  • «
                  • 1
                  • »
                  25PT300B-10 product photo
                  25PT300B-10
                  ID 808.RMN.25PT300B10
                  £ 475.00
                  1 list item
                  • «
                  • 1
                  • »