Time Dependent Dielectric Breakdown (TDDB)

Tip Coating

• Ti/Ir(2)

Tip Shape

3 sided 3 sided(2)

Tip Radius

• 25.0(2)

• 10.0(1)

Tip Height

12.5 12.5(2)

Reflex Coating

Ti/Ir Ti/Ir(2)

Applications

• Piezoelectrics / Ferroelectrics(2)
• Semiconductors / Microelectronics(2)
• Solar / Photovoltaics(2)
• Thin Films(2)

• Energy Storage(2)

Manufacturer

• Asylum Research(2)

By Category

Products Products(2)
AFM PROBES AFM PROBES(2)
SEARCH BY MODE SEARCH BY MODE(2)
Conductive AFM (CAFM) Conductive AFM (CAFM)(2)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(2)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(2)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(2)
Fast Current Mapping Fast Current Mapping(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(2)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(1)
Nanolithography Nanolithography(1)
AFM PROBES CATALOG AFM PROBES CATALOG(2)

In Stock

• true(2)