Kelvin Probe Force Microscopy (KPFM)

Tip Coating

• CoCr(1)

Tip Shape

3 sided 3 sided(1)

Tip Radius

• 20.0(1)

• 10.0(2)
• 100-300(1)
• 25.0(3)
• 32.0(1)
• 47.0(1)
• 5.0(2)
• <20nm(1)

Tip Height

14.0 14.0(1)

Reflex Coating

CoCr CoCr(1)

Applications

• Magnetics / Data Storage(1)

Manufacturer

• Asylum Research(1)

By Category

Products Products(5)
AFM PROBES AFM PROBES(5)
SEARCH BY MODE SEARCH BY MODE(4)
Conductive AFM (CAFM) Conductive AFM (CAFM)(3)
Magnetic Force Microscopy (MFM) Magnetic Force Microscopy (MFM)(1)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(2)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(2)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(1)
Fast Current Mapping Fast Current Mapping(1)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(1)
Nanolithography Nanolithography(2)
SEARCH BY SPECIFICATION SEARCH BY SPECIFICATION(1)
AFM PROBES CATALOG AFM PROBES CATALOG(5)