Kelvin Probe Force Microscopy (KPFM)

    • PtSi(2)
      • 100-300(1)
      • <20nm(1)
        • 15.0(2)
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                • PRODUCTS(2)
                • AFM PROBES(2)
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                • Tapping Mode(1)
                • Contact Mode(1)
                • Conductive AFM (CAFM)(2)
                • Piezoresponse Force Microscopy (PFM)(2)
                • Kelvin Probe Force Microscopy (KPFM)(2)
                • Electrostatic Force Microscopy (EFM)(2)
                • Fast Current Mapping(1)
                • Contact Resonance Viscoelastic Mapping(1)
                • Time Dependent Dielectric Breakdown (TDDB)(2)
                • Electrochemical Strain Microscopy (ESM)(1)
                • Nanolithography(1)
                • AFM PROBES CATALOG(2)
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                DD-FORTA product photo
                DD-FORTA
                ID 815.AN.DD-FORTA
                $ 1,400.00
                PtSi-ACT product photo
                PtSi-ACT
                ID 815.AN.PTSI-ACT
                $ 1,500.00
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