Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.
Each pack contains 10 probes
f = 300 kHz | k = 37 N/m | tip coating: PtSi
Conductive AFM probes coated with platinum silicide (PtSi) on both sides, suitable for electrical characterization in both contact mode and AC modes (non-contact/soft-tapping).
PtSi offers significant wear resistance over traditional metallic coatings (e.g. Pt) while still preserving both tip sharpness and low electrical resistance.
The probes are suitable in air for: conducting scanning probe microscopy (c-AFM), electric force microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), and piezo-response force microscopy (PFM).
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