Kelvin Probe Force Microscopy (KPFM)

Tip Coating

5nm Ti / 40nm Pt 5nm Ti / 40nm Pt(2)
CoCr CoCr(3)
PtSi PtSi(2)

Tip Shape

• 3 sided(2)
• Conical(2)
• Pyramidal(2)
• Rectangular (1)

Tip Radius

100-300 100-300(1)
20.0 20.0(1)
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Tip Height

12.0 12.0(2)
12.5 12.5(2)
14.0 14.0(1)
15.0 15.0(2)

Reflex Coating

5nm Ti / 40nm Pt 5nm Ti / 40nm Pt(2)
CoCr CoCr(3)
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Applications

• Magnetics / Data Storage(7)

• Biomaterials(5)
• Biomolecules(5)
• Cells and Tissues(1)
• Energy Storage(8)
• Food Science(5)
• Graphene / 2D Materials(5)
• Piezoelectrics / Ferroelectrics(3)
• Polymers(5)
• Semiconductors / Microelectronics(8)
• Solar / Photovoltaics(8)
• Thin Films(8)

By Category

PRODUCTS PRODUCTS(7)
AFM PROBES AFM PROBES(7)
SEARCH BY MODE SEARCH BY MODE(7)
Tapping Mode Tapping Mode(1)
Contact Mode Contact Mode(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(5)
Magnetic Force Microscopy (MFM) Magnetic Force Microscopy (MFM)(3)
Scanning Capacitance Mode (SCM) Scanning Capacitance Mode (SCM)(1)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(4)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(7)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(4)
Fast Current Mapping Fast Current Mapping(2)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(4)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(2)
Nanolithography Nanolithography(2)
SEARCH BY SPECIFICATION SEARCH BY SPECIFICATION(5)
AFM PROBES CATALOG AFM PROBES CATALOG(7)