Time Dependent Dielectric Breakdown (TDDB)

    • 5nm Ti / 40nm Pt(2)
    • Diamond(1)
    • PtSi(3)
        • 12.0(2)
        • 15.0(3)
        • 300.0(1)
          • 5nm Ti / 40nm Pt(2)
          • Cr/Au(1)
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                • PRODUCTS(6)
                • AFM PROBES(6)
                • SEARCH BY MODE(6)
                • Tapping Mode(2)
                • Contact Mode(2)
                • Conductive AFM (CAFM)(6)
                • Piezoresponse Force Microscopy (PFM)(6)
                • Kelvin Probe Force Microscopy (KPFM)(5)
                • Electrostatic Force Microscopy (EFM)(6)
                • Fast Current Mapping(4)
                • Contact Resonance Viscoelastic Mapping(2)
                • Time Dependent Dielectric Breakdown (TDDB)(6)
                • Electrochemical Strain Microscopy (ESM)(4)
                • Nanolithography(4)
                • AFM PROBES CATALOG(6)
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                DD-FORTA product photo
                DD-FORTA

                Force modulation probe with a polycrystalline diamond coating doped with boron for topography and electrical measurements with high tip durability.

                Each pack contains 10 probes

                ID 815.AN.DD-FORTA
                $ 1,400.00
                In Stock 3
                PtSi-FORT product photo
                PtSi-FORT

                Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.

                Each pack contains 10 probes

                ID 815.AN.PTSI-FORT
                $ 1,500.00
                In Stock 3
                SPARK-70-Pt product photo
                SPARK-70-Pt

                Conductive AFM - Silicon Probe with Pt tip side and reflex coating.

                Each pack contains 10 probes

                ID 817.NN.SPARK70PT
                $ 430.00

                Quantity Discounts

                Buy 5+ items ($ 365.50 each)
                In Stock 5
                AD-2.8-AS product photo
                AD-2.8-AS
                Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.

                Each pack contains 5 probes. 
                This product is not in stock but you can order and it will take around two weeks to get delivered.


                ID 814.AD-2.8-AS
                $ 900.00
                In Stock 2
                SPARK-350-Pt product photo
                SPARK-350-Pt

                Conductive AFM - Silicon Probe with Pt tip side and reflex coating.

                Each pack contains 10 probes

                ID 817.NN.SPARK350PT
                $ 430.00

                Quantity Discounts

                Buy 5+ items ($ 365.50 each)
                In Stock 5
                PtSi-ACT product photo
                PtSi-ACT

                Force modulation probe with platinum silicide coating for topography and electrical measurements with enhanced tip durability.

                Each pack contains 10 probes

                ID 815.AN.PTSI-ACT
                $ 1,500.00
                In Stock 3
                6 list items
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