A 3 remote day training course on AZtec Feature Particle Analysis split evenly accross the Days, allowing best practise analysis and interpretations of results. Download the course agenda here
Please book your course at least 3 weeks before the start date to give us enough time to arrange. Courses are for customers who have used the systems for a while, have basic operational knowledge rather than completely new users.
You will spend 3 days in this class which will teach you all about AZtec Feature Particle Analysis. The course will be held through a video call and the time for each day will be agreed beforehand with the participant.
Oxford Instruments will provide you with all materials needed for this course. At the end of the course, you will be rewarded with a certificate of attendence.
Place your order through the website and once you have paid for your training order, a team member from Oxford Instruments Nano Analysis will get in touch with you and will request all necessary information prior to the training to make sure all necessary arrangements are put in place.
Online training provides the convenience of learning from home without the added expense of travel. It is also a cost effective way of training multiple users to be proficient in operating your facility’s EDS, EBSD, or WDS systems.
Professional training will aid your staff by:
Oxford Instruments reserves the right to cancel any course up to 14 days before start of course due to insufficient number of participants. Registration is on a first come, first served basis. It is recommended that before attending a course, the student is familiar with general electron microscopy and basic principles of their analytical system. In addition to courses at our training facilities and online, Oxford Instruments can provide an Applications Specialist onsite to train lab users on your own system. This allows the course to be tailored to your specific needs and applications.
AZtec Feature Course Agenda:
Introduction to the system:
Overview of application
Data acquisition
• Setting up image parameters
• Setting up X-ray parameters
• Single field analysis
• Automate -Defining area layouts (Automate)
• Multiple area analysis (Automate)
• Classifications
• Reviewing Feature data
• Exporting data
Classification
• Setting up classification schemes
• Presenting results
Automated acquisitions
• Ways of automation
• Large Area analysis:
o Images
o Maps
• Automation in Feature analysis
Montage of data:
• Montaging images maps and feature runs
• Alignments
• Considerations and limitations
Advanced operation:
• Second pass
• Filters
• Optimizing settings and optimizing speed
• User profiles and applications