SPARK-70-Pt

817.NN.SPARK70PT

Conductive AFM - Silicon Probe with Pt tip side and reflex coating.

Each pack contains 10 probes

£ 350.00

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Buy 5+ items (£ 297.50 each)
In Stock 5

Description

f = 70 kHz   |   k = 2 N/m   |   reflex coating: Pt   |   tip coating: Pt

Conductive AFM probe for electrical characterization in both contact and AC modes (non-contact/soft tapping/force modulation). The Spark 70 Pt probe has a conductive platinum coating on both sides of the probe and exhibits exemplary dimensional tolerances and tip sharpness ensuring high quality imaging and performance.

Applications include conductive AFM (CAFM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), and piezoresponse force microscopy (PFM).

Details

  • SPARK-70-Pt Specifications
  • Frequency (kHz):
    70.0
  • Max Frequency (kHz):
    80.0
  • Min Frequency (kHz):
    45.0
  • Spring Constant (N/m):
    2.0
  • Max Spring Constant (N/m):
    3.5
  • Min Spring Constant (N/m):
    0.5
  • Tip Radius (nm):
    5.0
  • Tip Height (nm):
    12.0
  • Max Tip Height (nm):
    13.0
  • Min Tip Height (nm):
    10.0
  • Length, Width, Thickness (µm):
    225 x 30 x 2.5
  • Tip Shape:
    Conical
  • Tip Material:
    Silicon (n-type antimony)
  • Tip Coating:
    5nm Ti / 40nm Pt
  • Reflective Coating:
    5nm Ti / 40nm Pt
  • Manufacturer:
    NuNano

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