A 1 day remote training course for our Aztec Layerprobe system allowing best practise analysis and interpretations of results. The course will be held through Skype video call and time for each day will be agreed with participant. we will provide with all material needed.
Please book your course at least 3 weeks before the start date to give us enough time to arrange. Courses are for customers who have used the systems for a while, have basic operational knowledge rather than completely new users.
Gold Contract Customers: To to book your course, please email the date of the course and your contract certificate to our team by clicking the link here.
COURSE NAME: AZtec Layerprobe (Online)
COURSE DURATION: 1 day
A remote training course for our AZtec Layerprobe system allowing best practise analysis and interpretations of results. The course will be held through Skype video call and time for each day will be agreed with participant. we will provide with all material needed.
At the end of the course, a certificate of attendence will be given to the partecipant. Once you have placed and paid for your training order, a team member from Oxford Instruments Nano Analysis will get in touch with you and will request all necessary information prior to the training to make sure all necessary arrangements are put in place.
Oxford Instruments reserves the right to cancel any course up to 14 days before start of course due to insufficient number of participants. Registration is on a first come, first served basis. It is recommended that before attending a course, the student is familiar with general electron microscopy and basic principles of their analytical system. In addition to courses at our training facilities and online, Oxford Instruments can provide an Applications Specialist onsite to train lab users on your own system. This allows the course to be tailored to your specific needs and applications.
Please note: Minimum 4 attendees required to start each course, if not enough people, then customer will have to wait until next scheduled course.
LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher resolution than dedicated thin film measurement tools and ideal for a wide range of applications, including back- and front-end chip manufacturing, semiconductor R&D, optical and industrial coatings, nanoelectronic devices.
The course agenda covers:
Thin film analysis in the SEM
Characterises multiple layers beneath surface of the specimen
Non-destructive analysis
Thickness and composition of multiple layers from 2 nm to 2000 nm
Lateral resolution down to 200 nm
Easy to set-up for routine user, and a cost effective extension of your SEM or FIB-SEM
An extension to AZtecLive: seamlessly integrated and easily retrofittable to existing installations
LayerProbe is ideal for a wide range of applications, including back- and front-end chip manufacturing, semiconductor R&D, optical and industrial coatings, nanoelectronic devices: