Test Specimens

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    Highly Ordered Pyrolytic Graphite (HOPG) product photo
    Highly Ordered Pyrolytic Graphite (HOPG)
    HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopy. It is also used as a calibration specimen and cleaves almost like mica because of its layered structure. (HOPG 3.5 ± 1.5 Mosaic Spread)
    ID 51-1625-0744
    $ 177.52
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    Low KV Tin on Carbon Specimen on 10mm JEOL Stub product photo
    Low KV Tin on Carbon Specimen on 10mm JEOL Stub
    Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
    ID 51-1625-0555
    $ 202.24
    In Stock 3
    Universal Tin on Carbon Specimen Unmounted product photo
    Universal Tin on Carbon Specimen Unmounted
    Universal resolution test specimen with a particle size range from approximately <5nm - 30um. This tin on carbon test specimen has a very wide size range of tin spheres which give high contrast when imaged in the SEM.
    ID 51-1625-0552
    $ 211.30
    In Stock 10
    Low KV Gold on Carbon Specimen on 12.5mm Pin Stub product photo
    Low KV Gold on Carbon Specimen on 12.5mm Pin Stub
    Low voltage resolution test specimen with a particle size range from approximately <30 - 300nm.
    ID 51-1625-0548
    $ 145.45
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    Melinex Film (5 Pack) product photo
    Melinex Film (5 Pack)
    Melinex® film is a convenient substrate for growing cell cultures and for later incorporation into blocks. Pack of 5 sheets.
     
    ID 51-1625-0835
    $ 37.44
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    Universal Tin on Carbon Specimen on Pin Stub product photo
    Universal Tin on Carbon Specimen on Pin Stub
    Universal resolution test specimen with a particle size range from approximately 5nm - 30um
    ID 51-1625-0299
    $ 215.23
    In Stock 3
    Low KV Tin on Carbon Specimen on 12.5mm Pin Stub product photo
    Low KV Tin on Carbon Specimen on 12.5mm Pin Stub
    Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
    ID 51-1625-0554
    $ 202.24
    In Stock 3
    Low KV Tin on Carbon Specimen Unmounted product photo
    Low KV Tin on Carbon Specimen Unmounted
    Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
    ID 51-1625-0556
    $ 202.24
    In Stock 3
    Tin on Carbon Test Specimen - Unmounted-Thin product photo
    Tin on Carbon Test Specimen - Unmounted-Thin
    Resolution test specimen with a particle size range from approximately 10 - 100nm.
    ID 51-1625-0155
    $ 162.50
    In Stock 5
    FIB prepared ultra-thin TEM sectioning (standard section) product photo
    FIB prepared ultra-thin TEM sectioning (standard section)
    FIB prepared TEM sections (Foils/Lamella) prepared from your sample. A unique service in specimen preparation for TEM.
    ID 51-1625-0702
    $ 987.42
    Pre Order Now
    Combined test specimen, 3.05mm grid product photo
    Combined test specimen, 3.05mm grid
    A perforated carbon film is shadowed with gold and graphitised carbon particles are deposited.
    ID 51-1625-0221
    $ 67.27
    In Stock 10
    Low KV Gold on Carbon Specimen on 10mm JEOL Stub product photo
    Low KV Gold on Carbon Specimen on 10mm JEOL Stub
    Low voltage resolution test specimen with a particle size range from approximately <30 - 300nm.
    ID 51-1625-0546
    $ 145.45
    In Stock 5
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