Standards

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    Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB product photo
    Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB

     Model 70-1D with Cert Unmounted

    For General Purpose and Metrology Microscopes: A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.

    Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm.  Refer to calibration certificate for actual pitch.

    Surface: Silicon Oxide ridges on Silicon, 4 x 3 mm die.  Ridge height (about 35 nm) and width (about 35 nm) are not calibrated.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    ID 51-1625-0689
    $ 6,610.66
    Pre Order Now
    Multi Element Block of 15 Standards Auger MAC product photo
    Multi Element Block of 15 Standards Auger MAC
    MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES).

    This item is on pre-order and will take around 1-2 weeks to arrive.
    ID 51-1625-0687
    $ 3,615.30
    Pre Order Now
    Gold-On-Carbon SEM Test on 10mm JEOL Stub product photo
    Gold-On-Carbon SEM Test on 10mm JEOL Stub
    Resolution test specimen with a particle size range from approximately 5 - 150nm.
    ID 51-1625-0545
    $ 111.77
    Pre Order Now
    Micrometer Standards 0.1" in 0.001" divisions for reflected light product photo
    Micrometer Standards 0.1" in 0.001" divisions for reflected light
    These Micrometer Scale standards 0.1"; in 0.001" divisions for reflected light. They provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    ID 51-1625-0664
    $ 412.36
    Pre Order Now
    Gold on Carbon Resolution Test on Short Pin Stub product photo
    Gold on Carbon Resolution Test on Short Pin Stub
    Resolution test specimen with a particle size range from approximately 5 - 150nm.
    ID 51-1625-0547
    $ 107.47
    Pre Order Now
    Polystyrene Latex Particles product photo
    Polystyrene Latex Particles
    This range of polystyrene particles is excellent for SEM calibration purposes. It is possible to derive an internal standard of size by mixing a suitable concentration of these particles with the particles of unknown size being studied.
    ID 51-1625-0847
    $ 30.34
    Pre Order Now
    Multi Element Block of 5 Standards Auger MAC product photo
    Multi Element Block of 5 Standards Auger MAC
    MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES).

    This item is on pre-order and will take between 1-2 weeks to arrive.
    ID 51-1625-0680
    $ 1,773.72
    Pre Order Now
    Micrometer Standards – PS4 with NPL certificate product photo
    Micrometer Standards – PS4 with NPL certificate
    These calibrated standards provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    This item is on pre-order and will take between 1-2 weeks to arrive.
    ID 51-1625-0681
    $ 1,807.00
    Pre Order Now
    Low KV Tin on Carbon Specimen on 10mm JEOL Stub product photo
    Low KV Tin on Carbon Specimen on 10mm JEOL Stub
    Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
    ID 51-1625-0555
    $ 202.24
    In Stock 3
    Micrometer Standards –  PS1 with UKAS Certificate product photo
    Micrometer Standards – PS1 with UKAS Certificate
    These calibrated standards provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    This item is on pre-order and will take between 1-2 weeks to arrive.
    ID 51-1625-0676
    $ 897.52
    Pre Order Now
    Multi Element Block of 10 Standards Auger MAC product photo
    Multi Element Block of 10 Standards Auger MAC
    MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES).

    This item is on pre-order and will take between 1-2 weeks to arrive.
    ID 51-1625-0685
    $ 2,592.14
    Pre Order Now
    Graphitised Carbon Black, 3.05mm grid, Plane Spacing 0.34nm product photo
    Graphitised Carbon Black, 3.05mm grid, Plane Spacing 0.34nm
    Being stable and highly reproducible, this is a standard resolution test for transmission electron microscopes. Graphitised carbon black.
    ID 51-1625-0078
    $ 33.98
    In Stock 10
    Universal Tin on Carbon Specimen Unmounted product photo
    Universal Tin on Carbon Specimen Unmounted
    Universal resolution test specimen with a particle size range from approximately <5nm - 30um. This tin on carbon test specimen has a very wide size range of tin spheres which give high contrast when imaged in the SEM.
    ID 51-1625-0552
    $ 211.30
    In Stock 10
    Standard block set 1  (37 elements) product photo
    Standard block set 1 (37 elements)

    STANDARDS BLOCK SET 1 - 37 standards covering 42 elements plus Faraday cup.

    ID 51-1606-010
    $ 4,860.00
    In Stock 1
    Evaporated platinum / iridium, 3.05mm grid product photo
    Evaporated platinum / iridium, 3.05mm grid
    The evaporated platinum/iridium specimen is supplied on a perforated carbon support film that provides holes for ease of focus and astigmatism correction.
    ID 51-1625-0168
    $ 31.14
    In Stock 10
    Perforated carbon film, 3.05mm grid product photo
    Perforated carbon film, 3.05mm grid
    This specimen is one of the quickest and easiest to use for performance checks since it gives information about nearly all causes of loss of resolution.
    ID 51-1625-0535
    $ 41.03
    In Stock 5
    Low KV Gold on Carbon Specimen on 12.5mm Pin Stub product photo
    Low KV Gold on Carbon Specimen on 12.5mm Pin Stub
    Low voltage resolution test specimen with a particle size range from approximately <30 - 300nm.
    ID 51-1625-0548
    $ 145.45
    Pre Order Now
    2160 Lines/mm Diffraction Grating Replica 3mm product photo
    2160 Lines/mm Diffraction Grating Replica 3mm
    Shadow cast carbon replicas of diffraction line gratings - 2160 Lines/mm Diffraction Grating Replica 3mm
    ID 51-1625-0536
    $ 55.68
    Pre Order Now
    Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB product photo
    Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB
    Calibration Standard Model 70-1D with Cert Mounted on Pin Stub. For General Purpose and Metrology Microscopes: A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    ID 51-1625-0690
    $ 6,964.82
    Pre Order Now
    Universal Tin on Carbon Specimen on Pin Stub product photo
    Universal Tin on Carbon Specimen on Pin Stub
    Universal resolution test specimen with a particle size range from approximately 5nm - 30um
    ID 51-1625-0299
    $ 215.23
    In Stock 3
    Low KV Tin on Carbon Specimen on 12.5mm Pin Stub product photo
    Low KV Tin on Carbon Specimen on 12.5mm Pin Stub
    Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
    ID 51-1625-0554
    $ 202.24
    In Stock 3
    20 Thin Film Standards product photo
    20 Thin Film Standards
    These standards are supplied as fine powders that are dispersed onto holey-carbon films and are selected from the range of certified natural and synthetic compounds already in use by us to prepare bulk analysis standards.

    This item is on pre-order and will take between 1-2 weeks to arrive.

    ID 51-1625-0677
    $ 1,012.18
    Pre Order Now
    GSR Validation Standard 150nm Au product photo
    GSR Validation Standard 150nm Au
    GSR Validation Standard 150nm Au
    ID 51-1606-016
    $ 610.00
    Pre Order Now
    18 Biological Materials Block (25mm) product photo
    18 Biological Materials Block (25mm)

    MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES).

    This item is on pre-order and will take around 1-2 weeks to arrive.

    ID 51-1625-0684
    $ 2,592.14
    Pre Order Now
    Micrometer Standards – PS1 with NPL certificate product photo
    Micrometer Standards – PS1 with NPL certificate
    These calibrated standards provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.

    This item is on pre-order and will take around 1-2 weeks to arrive.
    ID 51-1625-0682
    $ 1,818.96
    Pre Order Now
    GSR Backscatter Standard Rh/Mn product photo
    GSR Backscatter Standard Rh/Mn
    GSR Backscatter Standard Rh/Mn.
    ID 51-1606-017
    $ 1,010.00
    Pre Order Now
    Cobalt standard product photo
    Cobalt standard
    Cobalt Standards block, Ideal for Quant optimization in INCA and Aztec. 5mm diameter x 5mm deep brass block.

    ID 51-1606-001
    $ 320.00
    In Stock 3
    EDX Calibration and health check standards block product photo
    EDX Calibration and health check standards block
    EDX calibration standard which has been specifically designed to help calibrate any EDX system, supplied with data sheet.
    ID 51-1606-044
    $ 2,780.00
    Pre Order Now
    High Resolution Au-C Test on 12.5mm Pin Stub product photo
    High Resolution Au-C Test on 12.5mm Pin Stub
    High Resolution Au-C Test on 12.5mm Pin Stub
    ID 51-1625-0148
    $ 283.67
    In Stock 5
    Universal Tin on Carbon product photo
    Universal Tin on Carbon
    Universal resolution test specimen with a particle size range from approximately <5nm - 30um. This tin on carbon test specimen has a very wide size range of tin spheres which give high contrast when imaged in the SEM.

    ID 51-1625-0551
    $ 206.93
    In Stock 3
    X-Ray Fluorescence Universal Set (20 elements) product photo
    X-Ray Fluorescence Universal Set (20 elements)

    These standards are supplied as ¼" (33mm) diameter pressed pellets or metal foils, and are prepared from selected high purity elements and compounds to ensure interference free-spectra. They are suitable for use by experienced spectroscopists as well as staff training.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    ID 51-1625-0683
    $ 2,210.00
    Pre Order Now
    Feature Standards Block (4 standards) product photo
    Feature Standards Block (4 standards)
    Feature Standards Block (4 standards)
    ID 51-1606-046
    $ 2,320.00
    Pre Order Now
    5 Thin Film Standards product photo
    5 Thin Film Standards
    These standards are supplied as fine powders that are dispersed onto holey-carbon films and are selected from the range of certified natural and synthetic compounds already in use by us to prepare bulk analysis standards.

    This item is on pre-order and will take between 1-2 weeks to arrive.

    ID 51-1625-0662
    $ 386.75
    Pre Order Now
    Gold-On-Carbon SEM Resolution Test on Pin Stub product photo
    Gold-On-Carbon SEM Resolution Test on Pin Stub
    Gold-On-Carbon SEM Resolution Test on Pin Stub
    ID 51-1625-0255
    $ 111.77
    In Stock 12
    Standard block set 2 (55 elements) product photo
    Standard block set 2 (55 elements)
    STANDARDS BLOCK SET 2 - 55 standards covering 56 elements plus Faraday cup.
    ID 51-1606-021
    $ 5,900.00
    In Stock 1
    Si3N4 (Si) mass thickness standard product photo
    Si3N4 (Si) mass thickness standard
    Si3N4 (Si) mass thickness standard
    ID 51-1606-064
    $ 2,040.00
    Pre Order Now
    Micrometer Standards –  PS1 with Graticules Certificate product photo
    Micrometer Standards – PS1 with Graticules Certificate
    These calibrated standards provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.

    This item is on pre-order and will take around 1-2 weeks to arrive.
    ID 51-1625-0673
    $ 798.20
    Pre Order Now
    Evaporated Aluminium Film 3mm product photo
    Evaporated Aluminium Film 3mm
    Evaporated Aluminium Film 3mm
    ID 51-1625-0183
    $ 29.90
    In Stock 14
    Low KV Tin on Carbon Specimen Unmounted product photo
    Low KV Tin on Carbon Specimen Unmounted
    Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
    ID 51-1625-0556
    $ 202.24
    In Stock 3
    Tin on Carbon Test Specimen - Unmounted-Thin product photo
    Tin on Carbon Test Specimen - Unmounted-Thin
    Resolution test specimen with a particle size range from approximately 10 - 100nm.
    ID 51-1625-0155
    $ 162.50
    In Stock 5
    Cross Grating Replica 3mm product photo
    Cross Grating Replica 3mm
    Shadow cast carbon replicas of diffraction line gratings.
    ID 51-1625-0211
    $ 62.88
    Pre Order Now
    WDS Standards block (20 standards) product photo
    WDS Standards block (20 standards)
    WDS Standards block (20 standards)
    ID 51-1606-045
    $ 6,199.00
    Pre Order Now
    Universal Standard Block (45 Standards with Faraday cup) product photo
    Universal Standard Block (45 Standards with Faraday cup)

    A Universal Standard block (32mm) which has been produced to incorporate an extensive selection of elements from across the periodic table focusing on specialised areas. With input from leading manufacturers, respected professionals, analysts and Electron Microscopy users worldwide, these standard blocks provide the end user with a comprehensive catalogue of reference materials.

    This item is on pre-order and will take around 1-2 weeks to arrive.

    ID 51-1625-0688
    $ 4,911.08
    Pre Order Now
    Micrometer Standards –  PS4 with Graticules Certificate product photo
    Micrometer Standards – PS4 with Graticules Certificate
    These calibrated standards provide traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, which is necessary under ISO provisions.

    This item is on pre-order and will take between 1-2 weeks to arrive.
    ID 51-1625-0674
    $ 843.44
    Pre Order Now
    Low KV Gold on Carbon Specimen on 10mm JEOL Stub product photo
    Low KV Gold on Carbon Specimen on 10mm JEOL Stub
    Low voltage resolution test specimen with a particle size range from approximately <30 - 300nm.
    ID 51-1625-0546
    $ 145.45
    In Stock 5
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