Kelvin Probe Force Microscopy (KPFM)

Tip Coating

CoCr CoCr(1)
Diamond Diamond(1)

Tip Shape

• Conical(1)
• Rectangular(1)

• 3 sided(3)

Tip Radius

10.0 10.0(1)
47.0 47.0(1)

Tip Height

12.5 12.5(1)
300.0 300.0(1)

Reflex Coating

CoCr CoCr(1)
Cr/Au Cr/Au(1)

Applications

• Energy Storage(1)
• Magnetics / Data Storage(1)
• Semiconductors / Microelectronics(1)
• Solar / Photovoltaics(1)
• Graphene / 2D Materials

• Piezoelectrics / Ferroelectrics(1)
• Thin Films(1)

By Category

PRODUCTS PRODUCTS(2)
AFM PROBES AFM PROBES(2)
SEARCH BY MODE SEARCH BY MODE(2)
Tapping Mode Tapping Mode(1)
Contact Mode Contact Mode(1)
Conductive AFM (CAFM) Conductive AFM (CAFM)(1)
Magnetic Force Microscopy (MFM) Magnetic Force Microscopy (MFM)(1)
Piezoresponse Force Microscopy (PFM) Piezoresponse Force Microscopy (PFM)(1)
Kelvin Probe Force Microscopy (KPFM) Kelvin Probe Force Microscopy (KPFM)(2)
Electrostatic Force Microscopy (EFM) Electrostatic Force Microscopy (EFM)(1)
Fast Current Mapping Fast Current Mapping(1)
Contact Resonance Viscoelastic Mapping Contact Resonance Viscoelastic Mapping(1)
Time Dependent Dielectric Breakdown (TDDB) Time Dependent Dielectric Breakdown (TDDB)(1)
Electrochemical Strain Microscopy (ESM) Electrochemical Strain Microscopy (ESM)(1)
Nanolithography Nanolithography(1)
AFM PROBES CATALOG AFM PROBES CATALOG(2)

In Stock

• true(2)