Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode. Each pack contains 10 probes.
This product is not in stock but you can preorder it. The current leadtime is 6-8 weeks.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Force Modulation Mode NanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging.
The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge.
They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm. Additionally, this probe offers a tip radius of curvature of less than 10 nm. The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.
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