Conductive AFM - Silicon Probe with Pt tip side and reflex coating.
Each pack contains 10 probes
f = 350 kHz | k = 42 N/m | reflex coating: Pt | tip coating: Pt
Conductive AFM probe for electrical characterization in both contact and AC modes (non-contact/tapping). The Spark 350 Pt probe has a conductive platinum coating on both sides of the probe and exhibits exemplary dimensional tolerances and tip sharpness ensuring high quality imaging and performance.
Applications include conductive AFM (CAFM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), and piezoresponse force microscopy (PFM).
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