Kelvin Probe Force Microscopy (KPFM)

    • Products(4)
    • AFM PROBES(4)
    • SEARCH BY APPLICATION(4)
    • Polymers(4)
    • Graphene & 2D Materials(4)
    • Energy Storage and Battery Research(4)
    • Semiconductor & Microelectronics(4)
    • Surface Roughness(1)
    • Topography & Morphology(1)
    • FA Defect Investigation(4)
    • Dopant Characterization(1)
    • Dielectric Breakdown(2)
    • Device Characterization(3)
    • Wafer Nanoelectrical Characterization(4)
    • Conductive AFM (CAFM)(3)
    • Kelvin Probe Force Microscopy (KPFM)(3)
    • Scanning Capacitance Microscopy (SCM)(1)
    • Piezoresponse Force Microscopy (PFM)(2)
    • Electrochemical Strain Microscopy (ESM)(3)
    • Electrostatic Force Microscopy (EFM)(3)
    • Time Dependent Dielectric Breakdown (TDDB)(3)
    • Fast Current Mapping(3)
    • Solar, Photovoltaics & Thermoelectrics(4)
    • Quantum Technology(1)
    • Thin Films & Coatings(4)
    • Piezo & Ferroelectrics(4)
    • Biomaterials(4)
    • SEARCH BY MODE(4)
    • SEARCH BY SPECIFICATION(2)
    • AFM PROBES CATALOG(4)
    • LEARN ABOUT PROBES(1)
    3 list items
    • «
    • 1
    • »
    AD-2.8-AS product photo
    AD-2.8-AS
    Product ID: 814.AD-2.8-AS
    € 810.00
    ASYELEC.01-R2 product photo
    ASYELEC.01-R2
    Product ID: 805.ASYELEC.01-R2
    € 440.00

    Quantity Discounts

    Buy 3-4 items (€ 396.00 each)
    Buy 5-9 items (€ 352.00 each)
    Buy 10-29 items (€ 308.00 each)
    Buy 30+ items (€ 264.00 each)
    ASYELEC.02-R2 product photo
    ASYELEC.02-R2
    Product ID: 805.ASYELEC.02-R2
    € 440.00

    Quantity Discounts

    Buy 3-4 items (€ 396.00 each)
    Buy 5-9 items (€ 352.00 each)
    Buy 10-29 items (€ 308.00 each)
    Buy 30+ items (€ 264.00 each)
    3 list items
    • «
    • 1
    • »