MICROSCOPY SUPPLIES

Colourful 8-Pocket Grid Boxes for storing 8 unclipped grids in one grid box, each with unique 5 digit serial number.

High quality V1 muscovite mica disks that come interleaved in a pack of 10 in four different diameters used in AFM calibration. (15mm size)

This range of carbon films has been prepared to provide very convenient, ready-to-use specimen support and come with the addition of a layer of evaporated carbon on nickel grids.

These volume/counting cells are used to define precise volumes of liquid for counting particles in a specified volume.

These disc carriers provide practical dust-free damage free storage for 12mm and 15mm SPM discs. Retrieve your discs from their carrier with the magnetic pick-up tool 51-1625-0921

This is a fine wire mesh copper 1500 (1000, 1500 or 2000 repeat distance per inch), ie. 25, 18.75 and 12.5µm

Resolution test specimen with a particle size range from approximately 5 - 150nm which is used for analysing the performance of scanning electron microscopes (SEMs). 

Ultra high resolution test specimen with a particle size range from approximately <2 - 30nm. This specimen has a smaller gold island particle size compared to the specimens. They are suitable for testing at instrument magnifications of x50,000 and above.

TEM Grid storage box that holds up to 50 tabbed TEM grids in alphanumeric labelled compartments. Dimensions: 77.5 x 41 x 9mm.

This convenient magnetic tool comes in handy when you are picking up and manoeuvring SPM discs without damage to mounted specimens.

This blue silicone rubber mould which fits into standard Petri dishes is useful for immunocytochemistry and post staining.

New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 12.7 x 12.7mm (1/2" x 1/2")

New Scanning Electron Microscopy Pin Stubs by PELCO. These new fundamentally improved pin stubs are for correlative, corroborative and repetitive microscopy and repetitive SEM imaging/analysis and specimen preparation. Choose your size from the dropdown menu. 19 x 19mm (3/4" x 3/4")

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.

A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.

A pack of 10 low profile aluminium flat pin stubs which accommodate specimens with small working distances in FIB applications.

A storage kit containing a strong white cardboard box with a separate insert that also includes 10 SEM stub storage tubes, 10 pin stubs and 10 labels along with 10 adhesive tabs.

The dimensions of the box are 200 x 95 x 55mm.

A storage kit containing a strong white cardboard box with a separate insert that also includes 10 SEM stub storage tubes, 10 pin stubs and 10 labels along with 10 spectrotabs.

The dimensions of the box are 200 x 95 x 55mm.

High-quality replacement tungsten filaments for Cambridge, LEO, Zeiss & AEI electron microscopes. They are made with made with specially designed jigs which ensure accuracy and reproducibility in production. Box of 10.